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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Goebel, D.M. |
| Copyright Year | 2004 |
| Description | Author affiliation: Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA (Goebel, D.M.) |
| Abstract | High voltage carbon and refractory metal electrodes employed in devices used in space, such as ion thrusters and traveling wave tubes, can be easily damaged by electrical breakdown and arcing events. Modification of the electrode surfaces due to these events can impact the voltage hold off capability of the surfaces, which could lead to additional arcing, further damage, and the potential for device failure. On the cathode-potential surface, the arc energy is deposited by all of the processes at the surface ultimately responsible for net electron emission, such as melting, vapor and paniculate formation, sputtering, ion bombardment, etc. On the anode-potential surface, the energy is deposited from the plasma or electron stream that crosses the gap, which causes surface damage by local heating. In spite of this energy dependence on the damage, many systems that use arc discharges characterize the amount of material removed from the surfaces and the lifetime of the device for voltage hold-off by the amount of current that passes through the arc, or the "Coulomb-rating". The results of a series of tests that were performed on the voltage hold off capability and damage to carbon-carbon composite surfaces and molybdenum surfaces due to induced arcing will be presented and discussed. Damage to the surfaces was characterized by the field emission performance after the arc initiation and SEM photographs for the different energy and coulomb-transfer arc conditions. Both conditioning and damage to the surfaces were observed, and will be related to the characteristics of the electrical breakdown |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 826599 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780385861 |
| DOI | 10.1109/MODSYM.2004.1433490 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2004-05-23 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electric breakdown Electrodes Surface discharges Breakdown voltage Space exploration Electron emission Sputtering Plasma devices Plasma materials processing Heating |
| Content Type | Text |
| Resource Type | Article |
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