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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Wu, Jei-Zheng Hui-Chun Yu Chien, Chen-Fu |
| Copyright Year | 2014 |
| Description | Author affiliation: Department of Business Administration, Soochow University, No.56, Sec. 1, Kueiyang Street, Taipei City 10048, TAIWAN (Wu, Jei-Zheng) || Department of Industrial Engineering & Engineering Management, National Tsing Hua University, 101, Section 2, Kuang-Fu Road, Hsinchu 30013, TAIWAN (Hui-Chun Yu; Chien, Chen-Fu) |
| Abstract | The high variety of and intermittent demand for semiconductor memory products frequently limits the use of forecast error normalization in estimating inventory. Inventory turnover is a practical performance indicator that is used to calculate the number of days for which a company retains inventory before selling a product. Although previous studies on inventory level settings have primarily applied information regarding demand variability and forecast error, few studies have investigated the inventory turnover for inventory decisions. Inventory turnover data are time scaled, suited for a small sample, and right censored to fit the input of survival analysis. In this study, a model in which inventory turnover and survival analysis were integrated was developed to estimate the production inventory survival function used to determine inventory level. Data analysis results based on real settings indicated the viability of using inventory survival analysis to determine semiconductor memory inventory level settings. |
| Starting Page | 2591 |
| Ending Page | 2599 |
| File Size | 413954 |
| Page Count | 9 |
| File Format | |
| e-ISBN | 9781479974863 |
| DOI | 10.1109/WSC.2014.7020103 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-12-07 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Safety Semiconductor memory Manufacturing Production Uncertainty Semiconductor device modeling Educational institutions |
| Content Type | Text |
| Resource Type | Article |
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