NDLI: Performance of diagnosis methods for IGBT open circuit faults in voltage source active rectifiers

Content Provider	IEEE Xplore Digital Library
Author	Rothenhagen, K. Fuchs, F.W.
Copyright Year	2004
Description	Author affiliation: Kiel Univ., Germany (Rothenhagen, K.; Fuchs, F.W.)
Abstract	Fault diagnosis of electrical drives is becoming more and more important today, since variable speed drives have become industrial standard in many applications. As an integral part of the drive, many faults occur within the inverter. One possible fault within the inverter is an open circuit transistor fault, whose diagnosis is subject of this paper. The practical performances of several open-circuit fault diagnostic methods are tested in simulation and experiment. An overview of the different strategies is given, including the algorithms used to localize the open transistor. Simulation results are presented and show different capabilities of each diagnostic strategy in terms of effectivity and false alarm resistivity for a voltage source inverter used as an active rectifier. The existing methods are further developed and adapted to a closed loop controlled active rectifier. An experimental setup in the laboratory is used to validate simulation results. Typical detection results are presented including time-to-detection measurements.
Sponsorship	IEEE Power Electon. Soc
Starting Page	4348
Ending Page	4354
File Size	460387
Page Count	7
File Format	PDF
ISBN	0780383990
ISSN	02759306
DOI	10.1109/PESC.2004.1354769
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-06-20
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault diagnosis Insulated gate bipolar transistors Circuit faults Voltage Rectifiers Inverters Circuit simulation Variable speed drives Performance evaluation Circuit testing
Content Type	Text
Resource Type	Article

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