NDLI: Scanning of electromagnetic radiation for EMC and data security purposes

Content Provider	IEEE Xplore Digital Library
Author	Kresalek, V. Smola, M. Kosina, T.
Copyright Year	2008
Description	Author affiliation: Dept. of Electrotechnics & Meas., Thomas Bata Univ., Zlin (Kresalek, V.; Smola, M.; Kosina, T.)
Abstract	A semi-automatic measurement system and diagnostic tool for localization of radiating parts of electronic devices in near-field was developed. A near-field scanning of electromagnetic emission is performed by the system. Maximal spatial resolution of the scanning is 0.2 mm which is sufficient for exact localization of radiating parts in the most cases. Frequency range of the measurement is from 30 MHz to 3 GHz. The advantage of the system is simplicity of implementation, as it is based entirely on commercially produced devices. The test receiver Rohde & Schwarz ESPI7 was used for the measurement of radiation level. The advantageous functions of the receiver such as fast frequency scan and simultaneous measurement with three detectors was utilized. The scanning procedure is controlled by a program which leads a user throughout all measurement steps. The program was made in Agilent VEE Pro. Important part of the measurement is processing of the measured data. Therefore, software for effective data visualization and analysis was developed. The key functions of the program are projection of the measured data on a photograph of the tested device, peak search and highlighting of critical places. Results of the scanning of a main board of a personal computer are presented.
Starting Page	117
Ending Page	120
File Size	595515
Page Count	4
File Format	PDF
ISBN	9781424418169
DOI	10.1109/CCST.2008.4751288
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-10-13
Publisher Place	Czech Republic
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Electromagnetic radiation Electromagnetic compatibility Data security Electromagnetic measurements Frequency measurement Testing Spatial resolution Detectors Data visualization Data analysis security Scanning visualization electromagnetic radiation near-field EMC
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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