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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Van Moer, Wendy Rolain, Yves |
| Copyright Year | 2002 |
| Description | Author affiliation: Vrije Universiteit Brussel (Dept. ELEC/TW); Pleinlaan 2; B-1050 Brussels(Belgium). Phone: +32.2.629.28.68; Fax: +32.2.629.28.50 (Rolain, Yves) || Vrije Universiteit Brussel (Dept. ELEC/TW); Pleinlaan 2; B-1050 Brussels(Belgium). Phone: +32.2.629.28.68; Fax: +32.2.629.28.50; Email: wendy.vanmoer@vub.ac.be (Van Moer, Wendy) |
| Abstract | This paper presents a method to measure the sensitivity of microwave components to memory effects caused by the DC-biasing circuit. This allows to determine the required (impedance) properties of the DC-biasing circuit to reduce slow dynamics under a certain level. The proposed measurement technique is based on the Nonlinear Vectorial Network Analyser (NVNA) [4], which allows to measure not only the absolute magnitude but also the absolute phase relations between the waves. Superimposing a multisine excitation signal on the DC-bias allows to measure the slow dynamics caused by the DC-biasing circuit as a function of frequency and input power. Furthermore, it is verified whether or not the measured phenomena depend on the type of excitation signal. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 3976668 |
| Page Count | 4 |
| File Format | |
| DOI | 10.1109/EUMA.2002.339353 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2002-09-23 |
| Publisher Place | Italy |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Impedance Phase measurement Distortion measurement Microwave measurements Radio frequency Microwave theory and techniques Signal design Radiofrequency amplifiers Microwave circuits Measurement techniques |
| Content Type | Text |
| Resource Type | Article |
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