NDLI: Circuit-Internal Characterization of MMICs using Two-Dimensional Electro-Optic Field Mapping in Combination with Microwave CAD Techniques

Content Provider	IEEE Xplore Digital Library
Author	David, G. Tempel, R. Ising, A. Kalayci, Y. Wolff, I. Jager, D.
Copyright Year	1994
Description	Author affiliation: Gerhard-Mercator-Universität GH Duisburg, Sonderforschungsbereich 254; IMST, Moerser Straße 316, D-47475 Kamp Lintfort, Germany. Phone: +49-203-379-2346, Fax: +49-203-379-3400 (Tempel, R; Kalayci, Y.) \|\| Gerhard-Mercator-Universität GH Duisburg, Sonderforschungsbereich 254; IMST, Moerser Straße 316, D-47475 Kamp Lintfort, Germany; FG Allgemeine und Theoretische Elektrotechnik, Bismarckstraße 81, D-47048 Duisburg, Germany. Phone: +49-203-379-2346, Fax: +49-203-379-3400 (Wolff, I.) \|\| Gerhard-Mercator-Universität GH Duisburg, Sonderforschungsbereich 254; FG Optoelektronik, Kommandantenstraße 60, D-47048 Duisburg, Germany. Phone: +49-203-379-2346, Fax: +49-203-379-3400 (David, G.; Ising, A.; Jager, D.)
Abstract	For the first time, distributions of microwave signals in an MMIC are measured by electro-optic field mapping techniques and compared with results of microwave CAD. In good agreement, the results show clear variations of the potential inside the MMIC. Moreover, the electro-optic measurement results reveal a pronounced nonlinear behaviour, of the circuit under saturation conditions. Thus, the combination of measurement and simulation provides the possibility of a circuit-intemal performance analysis of an MMIC. The results can be used as a basis for improvements of the design layout.
Starting Page	1386
Ending Page	1391
File Size	6463627
Page Count	6
File Format	PDF
DOI	10.1109/EUMA.1994.337409
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1994-09-05
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Microwave circuits MMICs Microwave theory and techniques Microwave measurements Frequency measurement Power measurement MESFETs Integrated circuit measurements Lasers and electrooptics Masers
Content Type	Text
Resource Type	Article

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