NDLI: A comparative analysis of RF-characteristics of high-density MCM-L technologies

Content Provider	IEEE Xplore Digital Library
Author	Thiel, A. Habiger, C. Troster, G.
Copyright Year	1998
Description	Author affiliation: Eidgenossische Tech. Hochschule, Zurich, Switzerland (Thiel, A.)
Abstract	The well known Motorola Reliability Test Vehicle (MRTV) activities have only recently been transferred to the Interconnection Technology Research Institute (ITRI). In 1977, an improved version of the Motorola MRTV-2.2, now ITRI-TV2.4A, was manufactured. 18 technologically different samples were submitted by 16 manufacturers worldwide for testing. ITRI-TV2.4A has been designed to be compatible with all major classes of high density MCM-L technologies based on photo-defined, laser ablated, mechanically punched, and plasma etched via generation. Besides various reliability test structures that occupy most of the routing area, some space is reserved for dedicated RF test structures. The Electronics Lab of ETH Zurich is responsible for development and measurement of these structures. In this contribution, the suitability of the different technologies for high frequency designs is compared on the basis of key characteristics such as propagation delays and dielectric losses. These performance figures are derived form vector network analyzer (VNA) and time domain reflectometry (TDR) measurement set-ups. The paper gives a brief introduction into the special conditions for RF design on very thin laminate substrates. Then, a comprehensive summary of recent RF measurement results obtained from ITRI-TV2.4A is presented. The paper concludes with an overview of the developmental status of the involved major classes of MCM-L fabrication technology.
Starting Page	13
Ending Page	18
File Size	560327
Page Count	6
File Format	PDF
ISBN	0780348508
DOI	10.1109/ICMCM.1998.670748
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-04-17
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Testing Space technology Radio frequency Dielectric measurements Manufacturing Plasma measurements Dielectric losses Dielectric substrates Vehicles Optical design
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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