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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Xiaoguang Liu Katehi, L.P.B. Chappell, W.J. Peroulis, D. |
| Copyright Year | 2009 |
| Description | Author affiliation: Birck Nanotechnology Center, School of Electrical and Computer Engineering, Purdue University, USA (Xiaoguang Liu; Chappell, W.J.; Peroulis, D.) || University of Illinois, Urbana-Champaign, USA (Katehi, L.P.B.) |
| Abstract | In this paper we present the first MEMS electrostatically-tunable loaded-cavity resonator that simultaneously achieves a very high continuous tuning range of 6.2 GHz:3.4 GHz (1.8:1) and quality factor of 460–530 in a volume of 18×30×4 $mm^{3}$ including the actuation scheme and biasing lines. The operating principle relies on tuning the capacitance of the loaded-cavity by controlling the gap between an electrostatically-actuated membrane and the cavity post underneath it. Particular attention is paid on the fabrication of the tuning mechanism in order to avoid a) quality factor degradation due to the biasing lines and b) hysteresis and creep issues. A single-crystal silicon membrane coated with a thin gold layer is the key to the success of the design. |
| Starting Page | 1149 |
| Ending Page | 1152 |
| File Size | 527764 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424428038 |
| ISSN | 0149645X |
| DOI | 10.1109/MWSYM.2009.5165905 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-06-07 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electrostatics Micromechanical devices Q factor Biomembranes Capacitance Fabrication Degradation Hysteresis Creep Silicon tunable resonator Evanescent-mode cavity MEMS quality factor tuning tunable filter |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electrical and Electronic Engineering Radiation |
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