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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Gilmore, R.J. Eron, M. Zhang, T. |
| Copyright Year | 1991 |
| Description | Author affiliation: Compact Software Inc., Paterson, NJ, USA (Gilmore, R.J.; Eron, M.; Zhang, T.) |
| Abstract | It is shown that by using a physical model to generate correlated parameters and response modeling to overcome long response times, even complex circuits can be optimized for maximum yield. A monolithic microwave integrated circuit (MMIC) distributed amplifier was simulated and optimized for maximum design yield. It is demonstrated that fitting the modeled circuit response to a simplified model that is a function only of the statistically perturbed circuit parameters enables large speed increases with little observed degradation in accuracy. Modeling devices at the process level allows meaningful data about the statistical parameters of devices to be deembedded. Improvements to the simulators, some of which now accept correlated and user-defined statistical data entry, allow realistic yielded determination during the design phase. |
| Starting Page | 1205 |
| Ending Page | 1208 |
| File Size | 326890 |
| Page Count | 4 |
| File Format | |
| ISBN | 0879425911 |
| ISSN | 0149645X |
| DOI | 10.1109/MWSYM.1991.147236 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1991-07-10 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | MMICs Distributed amplifiers Integrated circuit yield Circuit simulation Delay Microwave devices Microwave integrated circuits Monolithic integrated circuits Design optimization Degradation |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electrical and Electronic Engineering Radiation |
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