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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Stutzman, Brooke S. Verboncoeur, John P. |
| Copyright Year | 2014 |
| Description | Author affiliation: Michigan State University, East Lansing, 48824 USA (Verboncoeur, John P.) || United States Coast Guard Academy, 27 Mohegan Ave., New London, CT 06385 USA (Stutzman, Brooke S.) |
| Abstract | The operation of high-power microwave sources in relativistic magnetrons, magnetically insulated transmission lines for pulsed power systems, and Hull thrusters for space propulsion all rely on cross-field diodes. Electron migration from the cathode to the anode should be eliminated due to magnetic insulation, however, many electrons still transit the gap. This leads to the excitation of undesired modes and/or pulse shortening. Previous work has shown that not only does the presence of ions in a crossed-field gap increase the electron excursion toward the anode $region^{1},$ but electron scattering and ionization of the background species exacerbate this crossed-field $migration.^{2}$ We have also shown that the farther into the gap the scattering or ionization occurs, the greater the maximum excursion of the scattered or created $electron.^{3}$ In this work, we will break down the scattering problem further by looking at the scattering due to elastic collisions and excitation events separately. We will use a 1D PIC $code^{4}$ to compare the electron excursions based on scattering mechanism and scattering site. We will further compare the collision type with the expected energy change due to the collision mechanism. |
| Starting Page | 1 |
| Ending Page | 1 |
| File Size | 145213 |
| Page Count | 1 |
| File Format | |
| ISBN | 9781479927111 |
| e-ISBN | 9781479927135 |
| DOI | 10.1109/PLASMA.2014.7012568 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-05-25 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Scattering Magnetic separation Anodes Insulation Ionization Educational institutions |
| Content Type | Text |
| Resource Type | Article |
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