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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Niemeyer, J. Kieler, O. Müller, F. Kohlmann, J. Behr, R. Palafox, L. |
| Copyright Year | 2010 |
| Description | Author affiliation: Physikalisch-Technische Bundesanstalt, Braunschweig, Bundesallee 100, D-38166, Germany (Niemeyer, J.; Kieler, O.; Müller, F.; Kohlmann, J.; Behr, R.; Palafox, L.) |
| Abstract | The DC voltage across a Josephson junction is exactly determined by the number of single flux quanta Φ passing the junction per second. By locking this flux train to an external sinusoidal microwave with the frequency f or a pulse train with the pulse rate f in such a way that one flux quantum is transferred per microwave period or per pulse respectively, the junction DC voltage becomes V=Φf in the simplest case. The precision of V is only determined by the uncertainty of the frequency control. As the output voltage is relatively small (V=140µV for f=70GHz), large series arrays of n Josephson junctions must be used to increase the voltage to practical levels V=nΦf. With a sinusoidal 70 GHz microwave drive and series arrays of up to 14000 SIS tunnel junctions modern DC voltage standards were developed in the past which may reach a reproducibility of a few parts in $10^{−10}.$ These standards are commercially available and form the basis of the legal voltage metrology of most of the national laboratories worldwide. Because the reference voltages of these standards are widely overlapping it is difficult to rapidly adjust the desired voltage. It was therefore impossible to use these quantum voltmeters for the precise analysis of AC voltages. For this purpose the arrays had to be modified in many respects. |
| Starting Page | 1 |
| Ending Page | 3 |
| File Size | 498867 |
| Page Count | 3 |
| File Format | |
| ISBN | 9781424479009 |
| e-ISBN | 9781424478996 |
| DOI | 10.1109/MSMW.2010.5545975 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-06-21 |
| Publisher Place | Ukraine |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Junctions Niobium Microwave circuits Standards Microwave integrated circuits Stripline |
| Content Type | Text |
| Resource Type | Article |
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