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Energy yield of thin-film PV modules and the relevance of low irradiance, spectral and temperature effects

Content Provider	IEEE Xplore Digital Library
Author	Schweiger, M. Jahn, U. Herrmann, W. Gerber, A. Ulbrich, C. Rau, U.
Copyright Year	2013
Description	Author affiliation: Inst. of Energy- & Climate Res, Forschungszentrum Julich GmbH, Julich, Germany (Gerber, A.; Ulbrich, C.; Rau, U.) \|\| Solar innovation Dept., TOV Rheinland Energie und Umwelt GmbH, Cologne, Germany (Schweiger, M.; Jahn, U.; Herrmann, W.)
Abstract	The electrical performance and energy yield of 25 PV modules were studied in the laboratory and under moderate climate conditions. The study compares thin-film technologies (a-Si, a-Si/μc-Si, a-Si/a-Si, CIS, CIGS and CdTe) and crystalline silicon technologies (mono- and polycrystalline). Intensive laboratory tests were performed before and after the outdoor exposure with regard to low irradiance behavior as well as sensitivity to spectrum and module temperature. Measurements according to IEC 61853-1 provide information about the nonlinear behavior of thin-film modules in respect to irradiance and temperature. The spectral response was determined in the module plane according to IEC 60904-8. Combining the measured spectral response and the measured spectral solar irradiance data, an automated spectral mismatch correction could be implemented to improve monitoring. Additionally, the average photon energy factor was used to determine the dependency of the photo current on spectral shifts for the module technologies under investigation. In a final ranking the energy yield of all tested specimens is compared and the influence of spectrum, temperature and low irradiance behavior on the energy yield is quantified for moderate climate conditions.
Starting Page	007
Ending Page	017
File Size	856996
Page Count	11
File Format	PDF
e-ISBN	9781479905126
DOI	10.1109/PVSC-Vol2.2013.7179241
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-06-16
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Temperature measurement Temperature Temperature sensors IEC standards Temperature dependence Meteorology Silicon thin-film APE factor ECT method energy yield low irradiance behavior module characterization non-linearity spectral response spectrum
Content Type	Text
Resource Type	Article

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