NDLI: An equivalent circuit perturbation method for machining deviation and yield analysis of Substrate Integrated Waveguide filters

Content Provider	IEEE Xplore Digital Library
Author	Yang, Bin-Qi Zhou, Jian-Yi Ding, Wen-Qi Huang, Wei-Chen Yu, Zhi-Qiang
Copyright Year	2015
Description	Author affiliation: State Key Laboratory of Millimeter Waves, School of Information Science and Engineering, Southeast University, Nanjing, 210096, P R. China (Yang, Bin-Qi; Zhou, Jian-Yi; Ding, Wen-Qi; Huang, Wei-Chen; Yu, Zhi-Qiang)
Abstract	Substrate Integrated Waveguide (SIW) will play an important role in mass production of millimeter-wave systems due to the low-cost, mass-producible, compact characteristic and easy to integrate with other planar circuits. It is necessary to estimate the fabrication yield in mass production. However, yield analysis is an impracticable task for the full-wave simulation method due to large computational amount. This paper proposed an equivalent circuit perturbation method for rectangular SIW-cavity filters to achieve fast and accurate analysis of SIW filter with machining deviations. Based upon the Monte Carlo experiments, this method is applied to estimate the fabrication yield of a four square-cavity SIW filter at 28GHz. Moreover, measurements are carried out to obtain the actual performance of filters fabricated with standard PCB process.
Starting Page	1
Ending Page	3
File Size	405699
Page Count	3
File Format	PDF
ISBN	9781479987658
e-ISBN	9781479987672
DOI	10.1109/APMC.2015.7413538
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-12-06
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Decision support systems Mass production Fabrication Equivalent circuits Machining Frequency modulation Planar waveguides Yield analysis Substrate integrated waveguide (SIW) Equivalent circuit Machining deviation
Content Type	Text
Resource Type	Article

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