NDLI: Practical 3-D Shape Measurement Using Optimal Intensity-Modulated Projection and Intensity-Phase Analysis Techniques

Content Provider	IEEE Xplore Digital Library
Author	Cunwei Lu Genki Cho
Copyright Year	2006
Description	Author affiliation: Dept. of Electron. & Inf., Fukuoka Inst. of Technol. (Cunwei Lu; Genki Cho)
Abstract	In the field of 3D image measurement, a technique based on stripe pattern projection and observation image intensity analysis is expected to be able to detect several stripes by a single projection. It is necessary to increase the stripe number of the projection pattern in order to improve the measurement accuracy of depth distance. However, when the stripe number is increased, the difference of the intensity between stripes will be reduced and stripe detection will become difficult. In order to improve the detection accuracy of the stripe order and shorten the 3D measurement time, we use the optimal intensity-modulation projection (OIMP) technique, and in order to improve the depth distance measurement accuracy, we propose an intensity-phase analysis (IPA) technique. In the proposed IPA technique, the observation pattern be segmented by the intensity of the intensity-modulated stripe, and in every segmentation the depth distance of all pixels are obtained by phase analysis. By using a combination of the OIMP and IPA techniques, high-speed (single projection and double image captures) and high-accuracy (error less than 0.1%) practical 3D shape measurement can be realized
Sponsorship	IEEE CPS
Starting Page	870
Ending Page	873
File Size	693335
Page Count	4
File Format	PDF
ISBN	0769525210
ISSN	10514651
DOI	10.1109/ICPR.2006.940
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-08-20
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Shape measurement Pattern analysis Image analysis Time measurement Phase measurement Information analysis Image segmentation Distance measurement Measurement techniques Optical reflection
Content Type	Text
Resource Type	Article
Subject	Computer Vision and Pattern Recognition

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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