NDLI: An evaluation of error confidence interval estimation methods

Content Provider	IEEE Xplore Digital Library
Author	Bolle, R.M. Ratha, N.K. Pankanti, S.
Copyright Year	2004
Description	Author affiliation: IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA (Bolle, R.M.; Ratha, N.K.; Pankanti, S.)
Abstract	Reporting the accuracy performance of pattern recognition systems (e.g., biometrics ID system) is a controversial issue and perhaps an issue that is not well understood. This work focuses on the research issues related to the oft used confidence interval metric for performance evaluation. Using a biometric (fingerprint) authentication system, we estimate the false reject rates and false accept rates of the system using a real fingerprint dataset. We also estimate confidence intervals of these error rates using a number of parametric and non-parametric (e.g., bootstrapping) methods. We attempt to assess the accuracy of the confidence intervals based on estimate and verify strategy applied to repetitive random train/test splits of the dataset. Our experiments objectively verify the hypothesis that the traditional bootstrap and parametric estimate methods are not very effective in estimating the confidence intervals and magnitude of interdependence among data may be one of the reasons for their ineffective estimates. Further, we demonstrate that the resampling the subsets of the data samples (inspired from moving block bootstrap) may be one way of replicating interdependence among the data; the bootstrapping methods using such subset resampling may indeed improve the accuracy of the estimates. Irrespective of the method of estimation, the results show that the (1-/spl alpha/) 100% confidence intervals empirically estimated from the training set capture significantly smaller than (1-/spl alpha/) fraction of the estimates obtained from the test set.
Starting Page	103
Ending Page	106
File Size	281461
Page Count	4
File Format	PDF
ISBN	0769521282
ISSN	10514651
DOI	10.1109/ICPR.2004.1334479
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-08-26
Publisher Place	UK
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Estimation error Biometrics Fingerprint recognition Testing Databases Authentication Error analysis Engines Pattern recognition Statistics
Content Type	Text
Resource Type	Article
Subject	Computer Vision and Pattern Recognition

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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