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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Chan, K.S. Ye, J.D. Parkinson, P. Monakhov, E. Johansen, K.M. Vines, L. Svensson, B.G. Jagadish, C. Wong-Leung, J. |
| Copyright Year | 2012 |
| Description | Author affiliation: Department of Electronic Materials Engineering, Research School of Physics and Engineering, The Australian National University, Canberra, ACT 0200, Australia (Chan, K.S.; Ye, J.D.; Parkinson, P.; Jagadish, C.; Wong-Leung, J.) || Department of Physics/Centre for Materials Science and Nanotechnology, University of Oslo, P.O. Box 1048 Blindern, N-0316, Norway (Monakhov, E.; Johansen, K.M.; Vines, L.; Svensson, B.G.) |
| Abstract | ZnO is a wide bandgap semiconductor with huge potential to fabricate optoelectronic devices operating in the UV region. However, it is still not possible to achieve p-type ZnO, with hydrogen suggested to be a shallow donor that contributes significantly to the n-type conductivity in as grown ZnO. A better understanding on the role of H in ZnO is needed to realise p-type doping in ZnO. In this research, we utilised multiple structural and optical techniques to study the effects caused by H implantation in ZnO. The H implanted region in single crystal ZnO substrate was characterised by X-Ray diffraction, photoluminescence spectroscopy, secondary ion mass spectroscopy and transmission electron microscopy. XRD results show that H implantation created deformed layers with strain increasing linearly with implantation dose. A blue shift is also observed from the UV photoluminescence emission of the H implanted ZnO. |
| Starting Page | 219 |
| Ending Page | 220 |
| File Size | 671007 |
| Page Count | 2 |
| File Format | |
| ISBN | 9781467330473 |
| ISSN | 10972137 |
| e-ISBN | 9781467330466 |
| DOI | 10.1109/COMMAD.2012.6472439 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-12-12 |
| Publisher Place | Australia |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Zinc oxide Hydrogen X-ray scattering Annealing Temperature measurement Doping Optical diffraction |
| Content Type | Text |
| Resource Type | Article |
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