NDLI: Measuring the performance impact of permanent faults in modern microprocessor architectures

Content Provider	IEEE Xplore Digital Library
Author	Foutris, N. Gizopoulos, D. Kalamatianos, J. Sridharan, V.
Copyright Year	2013
Description	Author affiliation: AMD Res., Boxborough, MA, USA (Kalamatianos, J.; Sridharan, V.) \|\| Univ. of Athens, Athens, Greece (Foutris, N.; Gizopoulos, D.)
Abstract	Large silicon parts of modern microprocessors are dedicated to components that increase performance but don't determine functional correctness. Permanent hardware faults in such components lead to performance fluctuation (not necessarily degradation) but do not produce functional errors. This fact has been identified previously but neither an accurate classification of the behavior of permanent faults in these components over a set of CPU benchmarks nor detailed measurements of the magnitude of their performance impact has been reported. Depending on such measurements the performance-related components of microprocessors can be disabled in fine or coarse granularities, salvaging the microprocessor functionality although at different performance levels. In this paper, we describe a comprehensive framework for the analysis of the impact of permanent faults in the arrays and the control logic of key performance components. We apply a statistically safe, fault injection campaign to the performance components on a modified version of the cycle accurate x86-based architectural simulator PTLsim running the SPEC2006 benchmarks suite. Our evaluation reveals the differences in the effect of faults and their performance impact across the components as well as within each component. We summarize the fault effect classification and further analyze the performance impact (IPC) of faults in their arrays and control parts.
Starting Page	181
Ending Page	184
File Size	1688249
Page Count	4
File Format	PDF
ISBN	9781479906642
DOI	10.1109/IOLTS.2013.6604075
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-07-08
Publisher Place	Greece
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Testing performance faults fault tolerance
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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