NDLI: A comprehensive soft error analysis methodology for SoCs/ASICs memory instances

Content Provider	IEEE Xplore Digital Library
Author	Alexandrescu, D.
Copyright Year	2011
Description	Author affiliation: iRoC Technologies, Grenoble, France (Alexandrescu, D.)
Abstract	Memory blocks are important features of any design, in terms of functionality, silicon area and reliability. Embedded SRAM instances are critical contributors to the overall Soft Error Rate of the system, requiring a careful consideration of the reliability aspects and adequate sizing of the error mitigation capabilities. While error detecting and correcting codes are widely available and particularly effective against most types of Single Event Effects, Multiple Bit Upsets and progressive errors accumulation may defeat the error correction capabilities of standard SECDED codes. Accordingly, the paper presents an overall approach to the structural and functional SER analysis of the memory instances in addition to error mitigation efficiency estimation. Moreover, intrinsic, nominal, SER figures are not a realistic indicator of the memory behavior for a given application. We propose instead, an opportunity window metric, associated to the notion of data lifetime in the memory, as extracted from functional simulations. Lastly, based on the opportunity window figures, targeted and efficient fault simulation campaigns can be prepared to estimate high-level functional failures induced by Single Events. The overall memory SER evaluation aims at assisting the designers to improve the performances of the design and to document the reliability figures of the system.
Starting Page	175
Ending Page	176
File Size	122620
Page Count	2
File Format	PDF
ISBN	9781457710537
e-ISBN	9781457710568
DOI	10.1109/IOLTS.2011.5993833
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-07-13
Publisher Place	Greece
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Throughput Error analysis Neutrons Reliability Single event upset Computational modeling data lifetime Single Event Upsets Soft Errors Soft Error Rate Memory SER SER De-rating
Content Type	Text
Resource Type	Article

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