NDLI: The use of cluster quality for track fitting in the CSC detector

Content Provider	IEEE Xplore Digital Library
Author	Etzion, E. Primor, D. Mikenberg, G. Amram, N. Messer, H.
Copyright Year	2006
Description	Author affiliation: Sch. of Phys. & Astron., Tel Aviv Univ. (Etzion, E.)
Abstract	The new particle accelerators and its experiments create a challenging data processing environment, characterized by large amount of data where only small portion of it carry the expected new scientific information. Modern detectors, such as the Cathode Strip Chamber (CSC), achieve high accuracy of coordinate measurements (between 50 to 70 microns). However, heavy physical backgrounds can decrease the accuracy significantly. In the presence of such background, the charge induced over adjacent CSC strips (cluster) is different from the ideal Matheison distribution. The traditional least squares method which takes the same ideal position error for all clusters loses its optimal properties on contaminated data. A new technique that calculates the cluster quality and uses it to improve the track fitting results is suggested. The algorithm is applied on test beam data, and its performance is compared to other fitting methods. It is shown that the suggested algorithm improves the fitting performance significantly.
Starting Page	1
Ending Page	4
File Size	238859
Page Count	4
File Format	PDF
ISBN	1424405602
ISSN	10957863
DOI	10.1109/NSSMIC.2006.356098
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-10-29
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Detectors Strips Clustering algorithms Linear particle accelerator Data processing Cathodes Coordinate measuring machines Pollution measurement Least squares methods Testing cluster quality track fitting CSC detector
Content Type	Text
Resource Type	Article

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