NDLI: A systematic study on discharge-induced GEM-failure phenomena

Content Provider	IEEE Xplore Digital Library
Author	Cardini, A.
Copyright Year	2005
Description	Author affiliation: Ist. Nazionale di Fisica Nucl., Cagliari (Cardini, A.)
Abstract	The gas electron multiplier (GEM), proposed by F. Sauli in 1997, is now a well established concept for electron amplification in gas detectors. One of the most important reason of the success and of the widespread use of GEM-based detectors is the reliability of the electron amplifying structure with respect to discharges, in contrast to other types of micro-pattern detectors. However, even if a GEM foil can tolerate a certain amount of discharges, these are "memorized" in the amplifying structure and after exceeding a certain amount of discharges the GEM foil operation will inevitably fail. This fact has to be careful considered when planning the use of GEM-based detectors in an environment where heavily ionizing particles can considerably increase the GEM discharge probability. In this paper a statistical model predicting the GEM survival probability to discharge events is proposed. This model requires in input the knowledge of the effects of discharges in a single GEM hole, and these effects were measured by means of a specially designed structure where single GEM holes can be individually supplied and studied. Results from these measurements are fed in the model in order to predict the GEM survival probability distribution. This probability distribution is found to be in agreement with measurements performed on standard triple-GEM detectors where discharges are induced by means of an alpha source. The model presented here can be a valuable tool to help designing GEM-based detectors and estimating how many detectors will fail after integrating a certain amount of discharges
Starting Page	1127
Ending Page	1131
File Size	307853
Page Count	5
File Format	PDF
ISBN	0780392213
ISSN	10957863
DOI	10.1109/NSSMIC.2005.1596449
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-10-23
Publisher Place	Puerto Rico
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault location Gas detectors Electrodes Cathodes Anodes Electron multipliers Predictive models Probability distribution Copper Radiation detectors
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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