NDLI: Thermoluminescence and scintillation properties of rare earth oxyorthosilicate scintillators

Content Provider	IEEE Xplore Digital Library
Author	Szuprvczvnski, P. Melcher, C.L. Spurrier, M.A. Maskarinec, M.P. Carey, A.A. Wojtowicz, A.J. Drozdowski, W. Wisniewski, D. Nutt, R.
Copyright Year	2004
Description	Author affiliation: CTI Molecular Imaging, Inc., Knoxville, TN, USA (Szuprvczvnski, P.; Melcher, C.L.; Spurrier, M.A.; Maskarinec, M.P.; Carey, A.A.)
Abstract	In recent years the scintillation properties of several cerium-doped rare earth oxyorthosilicate scintillators, Ln/sub 2/SiO/sub 5/:Ce where Ln = Y, La - Lu, have been reported and, in some cases, extensively studied. In addition, binary and ternary compounds such as (Lu,Y)/sub 2/SiO/sub 5/:Ce, (Lu,Gd)/sub 2/SiO/sub 5/ and (Lu,Y,Gd)/sub 2/SiO/sub 5/:Ce have been reported. All of these crystals have either monoclinic P or C structures with characteristic SiO/sub 4/ tetrahedra and trivalent cations occupying two unique crystallographic positions. The trivalent cerium activator ions are assumed to occupy the cation lattice sites and possibly interstitial positions as well. The excited 5d state of Ce/sup 3+/ is split into 3 observable levels with luminescence emission occurring only from the lowest 5d level to the 4f ground state (/spl sim/3 eV) with a Stokes shift of /spl sim/ 0.5 eV. The band gap is about 6 eV, and the index of refraction is close to 1.8, with some variation according to crystallographic axes. Despite these similarities, important differences remain among the crystals including scintillation efficiency, decay time, rise time, and afterglow. In this paper, we report thermoluminescence measurements between 10K and 350K that allow the determination of trapping levels that may influence scintillation properties. The thermoluminescence data shows that the various scintillators compositions have surprisingly dissimilar sets of traps that may at least partially explain some of the differences in their scintillation properties.
Starting Page	727
Ending Page	731
File Size	526478
Page Count	5
File Format	PDF
ISBN	0780382579
ISSN	10823654
DOI	10.1109/NSSMIC.2003.1351802
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-10-19
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Molecular imaging Technological innovation Telephony Crystals Physics Crystallography Cerium Electron traps Charge carriers Temperature measurement
Content Type	Text
Resource Type	Article

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