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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Kawashima, Y. Atuti, D. Nakada, K. Okada, M. Morie, T. |
| Copyright Year | 2009 |
| Description | Author affiliation: Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa-shi, Japan (Okada, M.) || Graduate School of Life Science and Systems Engineering, Kyushu Institute of Technology, Kitakyushu-shi, Japan (Kawashima, Y.; Atuti, D.; Nakada, K.; Morie, T.) |
| Abstract | This paper proposes a novel region-based coupled Markov Random Field (MRF) model for coarse image region segmentation on silicon platforms. Coupled MRF models are classified into boundary- and region-based models, in which hidden variables are referred to as a line process and a label process, respectively. These hidden variables are crucial for detecting discontinuities in motion, intensity, color, and depth in visual scenes. For a coarse image region segmentation task, we address a region-based coupled MRF model with hidden phase variables. It is shown that the region-based coupled MRF model has an advantage over the resistive-fuse network, which is a boundary-based coupled MRF model, in dealing with the hidden variables explicitly. These models work complementarily for a coarse image region segmentation task. For real-time region segmentation operation, we have designed a merged analog/digital CMOS circuit implementing both functions of the boundary- and region-based coupled MRF models using a pulse modulation approach. |
| Starting Page | 1559 |
| Ending Page | 1565 |
| File Size | 10905173 |
| Page Count | 7 |
| File Format | |
| ISBN | 9781424435487 |
| ISSN | 10987576 |
| DOI | 10.1109/IJCNN.2009.5179030 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-06-14 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Pulse width modulation Image segmentation Very large scale integration Semiconductor device modeling Coupling circuits Markov random fields Silicon Motion detection Layout CMOS digital integrated circuits |
| Content Type | Text |
| Resource Type | Article |
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