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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Ozawa, S. Kawashima, Y. Shaoning Pang Kasabov, N. |
| Copyright Year | 2009 |
| Description | Author affiliation: Knowledge Engineering & Discover Research Institute, Auckland University of Technology, Private Bag 92006, 1142, New Zealand (Shaoning Pang; Kasabov, N.) || Graduate School of Engineering, Kobe University, 657-8501, Japan (Ozawa, S.; Kawashima, Y.) |
| Abstract | In this paper, we propose a new Chunk IPCA algorithm in which an optimal threshold of accumulation ratio is adaptively selected such that the classification accuracy is maximized for a validation data set. In order to obtain a proper set of validation data, an online clustering method called Evolving Clustering Method (ECM) is introduced into Chunk IPCA. In the proposed Chunk IPCA called CIPCA-ECM, training data are first separated into the subsets of every class; then, ECM is applied to each subset to update the validation data set. In the experiments, the evaluation of the proposed Chunk IPCA algorithm is carried out using the four UCI data sets and the effectiveness of updating the threshold is discussed. The results suggest that the incremental learning of an eigenspace in the proposed CIPCA-ECM is stably carried out, and a compact and effective eigenspace is obtained over the entire learning stages. The recognition accuracy of CIPCA-ECM is almost equal to the best performance of CIPCA-FIX in which an optimal threshold is manually predetermined. |
| Starting Page | 2394 |
| Ending Page | 2400 |
| File Size | 1466532 |
| Page Count | 7 |
| File Format | |
| ISBN | 9781424435487 |
| ISSN | 10987576 |
| DOI | 10.1109/IJCNN.2009.5178997 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-06-14 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Principal component analysis Electrochemical machining Feature extraction Clustering algorithms Clustering methods Training data Eigenvalues and eigenfunctions Neural networks Linear discriminant analysis Face recognition |
| Content Type | Text |
| Resource Type | Article |
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