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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Yun Xiang Chantem, T. Dick, R.P. Hu, X.S. Li Shang |
| Copyright Year | 2010 |
| Description | Author affiliation: CSE Department, University of Notre Dame, IN 46556, USA (Chantem, T.; Hu, X.S.) || ECE Department, University of Colorado, Boulder, 80309, USA (Li Shang) || EECS Department, University of Michigan, Ann Arbor, 48109, USA (Yun Xiang; Dick, R.P.) |
| Abstract | The reliability of multi-processor systems-on-chip (MPSoCs) is affected by several inter-dependent system-level and physical effects. Accurate and fast reliability modeling is a primary challenge in the design and optimization of reliable MPSoCs. This paper presents a reliability modeling framework that integrates device-, component-, and system-level models. This framework contains modules for electromigration, time-dependent dielectric breakdown, stress migration, and variable-amplitude thermal cycling. A new statistical reliability distribution is proposed for accurate characterization of components containing too few devices for an extreme value distribution to be appropriate. A hierarchical system-level survival lattice based Monte Carlo technique is used to estimate the temporal fault distributions of MPSoCs that use arbitrary static and dynamic reliability-enhancing redundancy schemes. Physical process variation, which may have a significant impact on MPSoC reliability, is considered in the model. The proposed modeling technique has 5% average error in mean time to failure and reduces simulation time by nearly 3 orders of magnitude relative to a non-hierarchical Monte Carlo technique. |
| Starting Page | 297 |
| Ending Page | 306 |
| File Size | 1515979 |
| Page Count | 10 |
| File Format | |
| ISBN | 9781605589053 |
| e-ISBN | 9781605589053 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-10-24 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Association for Computing Machinery, Inc. (ACM) |
| Subject Keyword | Equations Mathematical model Performance Reliability |
| Content Type | Text |
| Resource Type | Article |
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