NDLI: On the Outage Capacity of a Dying Channel

Content Provider	IEEE Xplore Digital Library
Author	Meng Zeng Rui Zhang Shuguang Cui
Copyright Year	2008
Description	Author affiliation: Inst. for Infocomm Res., A*STAR, Singapore (Rui Zhang) \|\| Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX (Meng Zeng; Shuguang Cui)
Abstract	In this paper, we investigate a new type of channels named as "dying" channels, which are resulted in wireless networks subject to random fatal impacts, e.g., sensor networks under sudden physical attacks or cognitive radio networks with unpredictable primary user occupancy. Under such circumstances, it is critical to quantify how fast and reliable information can be collected over "dying" links. In this paper, we focus on a simple point-to-point communication setting and model the "dying" channel by the traditional if-block block-fading (BF) model subject to a fatal attack that may happen randomly in any of the K blocks. The resultant channel is non-ergodic and delay-limited in nature, and thus its information-theoretic limit can be measured by adopting the conventional outage capacity concept. An outage event in a "dying" channel could be caused by two mechanisms: fading over finite K blocks; and random attack within K blocks. In this paper, we present the general problem formulation to determine the outage capacity of the "dying" channel, as well as the corresponding optimal transmit power allocation over the K blocks, based upon the known probability distributions of both the fading channel and the attack time. The optimal power allocation turns out to be in general nonuniform with a decreasing profile over transmission blocks. In addition, there exists an optimal number of blocks over which the codeword is spanned. Some other interesting observations are also made pertinent to the optimal transmission over a "dying" channel.
Starting Page	1
Ending Page	5
File Size	202507
Page Count	5
File Format	PDF
ISBN	9781424423248
ISSN	1930529X
DOI	10.1109/GLOCOM.2008.ECP.198
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-11-30
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fading Delay Wireless sensor networks Capacity planning Cognitive radio Additive white noise AWGN channels Radio transmitters Capacitive sensors Telecommunication network reliability
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in