NDLI: The к-μ Extreme distribution: Characterizing severe fading conditions

Content Provider	IEEE Xplore Digital Library
Author	Rabelo, G.S. Dias, U.S. Yacoub, M.D.
Copyright Year	2009
Description	Author affiliation: School of Electrical and Computer Engineering, University of Campinas, Brazil (Rabelo, G.S.; Dias, U.S.; Yacoub, M.D.)
Abstract	This paper presents the к-μ Extreme fading distribution, which is used for characterizing mobile radio propagation under severe fading conditions. The distribution is adjusted to field data extracted from the literature and compared to another model recently proposed elsewhere, namely the Two-Ray model. Adjustment results show that the к-μ Extreme distribution is flexible and suitable to model the severe fading conditions. A closed-form expression for the average BER in non-coherent binary modulation schemes is derived. Finally, performance of the selection combining technique is evaluated in terms of the outage probability.
Starting Page	244
Ending Page	248
File Size	2824156
Page Count	5
File Format	PDF
ISBN	9781424453566
ISSN	16794389
DOI	10.1109/IMOC.2009.5427590
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-11-03
Publisher Place	Brazil
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Rayleigh channels Wireless sensor networks Closed-form solution Bit error rate Diversity reception Wireless LAN Weibull fading channels Predictive models Land mobile radio Data mining Severe Fading Conditions к-μ Extreme Distribution Two-Ray Distribution Fading Channels Hyper-Rayleigh Fading
Content Type	Text
Resource Type	Article

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