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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Maitani, M. Heayoung Yoon Lintao Cai Cabarcos, O.M. Mayer, T.S. Allara, D.L. |
| Copyright Year | 2007 |
| Description | Author affiliation: Pennsylvania State Univ., University Park (Maitani, M.) |
| Abstract | In this paper, we report the direct in-junction characterization of OAn SAM embedded in the crossed-wire junction structure which is more reliable and available for spectroscopic analysis to reveal the origin of switching characteristics. The crossed-wire junction is prepared with the Au nano wire (diameter: ~300nm) aligned on OAn SAM on Au bottom wire (width: ~1mum) with Electric-field assisted assembly technique. The OAn SAM on planar substrate prepared by same preparation procedure for the crossed-wire junction is characterized by infrared reflection spectroscopy (IRS), x-ray photoelectron spectroscopy (XPS), and atomic force microscope (AFM) to avoid the unfavorable contamination or side reaction during the device preparation process. Inelastic electron tunneling spectroscopy (IETS) is applied to the electronically prepared high and low state of OAn junction to understand the molecular level phenomenon in the crossed-wire junction. The distinct spectra of high and low state of the junction are observed under temperature controlled condition (~4K). Surface Plasmon enhanced Raman spectroscopy (SERS) is utilized to the crossed-wire junction to reveal the chemical and conformational characteristics change in high and low state. According to obtained results, we believe that the origin of electrical conductance switching behavior is from conformation and redox state changes of embedded molecules. |
| Starting Page | 492 |
| Ending Page | 493 |
| File Size | 650060 |
| Page Count | 2 |
| File Format | |
| ISBN | 9784990247249 |
| DOI | 10.1109/IMNC.2007.4456319 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-11-05 |
| Publisher Place | Japan |
| Access Restriction | Subscribed |
| Rights Holder | Japan Soc of Applied Physics |
| Subject Keyword | Self-assembly Nanoscale devices Spectroscopy Gold Wire Infrared spectra Atomic force microscopy Assembly Reflection Photoelectron microscopy |
| Content Type | Text |
| Resource Type | Article |
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