NDLI: Defining the sensitivity of polarimetric parameters to crop residue patterns during-harvest

Content Provider	IEEE Xplore Digital Library
Author	Lingli Zhao Jie Yang Pingxiang Li Shaoping Deng Lu Liao
Copyright Year	2013
Description	Author affiliation: State Key Lab. of Inf. Eng. in Surveying, Mapping & Remote Sensing, Wuhan Univ., Wuhan, China (Lingli Zhao; Jie Yang; Pingxiang Li; Shaoping Deng; Lu Liao)
Abstract	The sensitivity of polarimetric parameters to different residue patterns during harvest has been investigated in the paper. Several crop residue cover types called residue patterns during harvest have been selected. They include harvested wheat fields with burned and non-burned straws, the swathed oilseed rapes with different moisture, the rape swathes aligned in different directions, the non-lodging wheat and lodging wheat before harvest. A set of polarimetric parameters include backscattering coefficients, coherence coefficients, polarimetric phase differences, and variables derived from Cloude decomposition are made use of. Sensitivity analysis was conducted on one Radarsat-2 quad-pol image and one TerraSAR-X dual-pol image acquired over a farmland of China. The results indicate that polarimetric parameters have various responses to different residue patterns. The residue amounts, direction and crop harvest state are the main factors that result in the fluctuation of polarimetric scattering characteristics. In addition, it is revealed that multi-polarimetric image with short wavelength has the potential to guide the farming behaviors during harvest.
Sponsorship	IEEE Geosci. Remote Sens. Soc.
Starting Page	3227
Ending Page	3230
File Size	447897
Page Count	4
File Format	PDF
ISBN	9781479911141
ISSN	21536996
DOI	10.1109/IGARSS.2013.6723514
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-07-21
Publisher Place	Australia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Agriculture Scattering Backscatter Monitoring Clouds Remote sensing Moisture crop residue patterns PolSAR
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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