NDLI: Random pattern testing for MCM interconnect using computer generated hologram technology

Content Provider	IEEE Xplore Digital Library
Author	Chi-Yuan Chang
Copyright Year	2010
Description	Author affiliation: Department of Computer Science and Information Engineering, Jinwen University of Science Technology, Taipei, Taiwan (Chi-Yuan Chang)
Abstract	Future computers will need to incorporate the parallelism of optical interconnections in order to achieve projected performance within reasonable size, power, and speed. Optical interconnection provides more advantage than traditional electrical interconnection in large system. In this paper we will propose a Markov model to determine the number of random patterns required for testing of optical interconnect. We describe the random vector to test interconnect and show that a little of random vectors can give close to 100% detection quality. The faults under consideration include stuck-at faults and bridging (short) faults. The simulation results suggest that if the length of boundary scan is large, the traditional method on minimization of test vectors may not lead to a better result. In stead, one should concentrate on choosing the random vector.
Starting Page	2653
Ending Page	2657
File Size	161818
Page Count	5
File Format	PDF
ISBN	9781424465262
e-ISBN	9781424465279
DOI	10.1109/ICMLC.2010.5580914
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-07-11
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Markov processes Optical interconnections Testing Integrated circuit interconnections Driver circuits Computers Machine learning Markov model Interconnects Random Testing
Content Type	Text
Resource Type	Article

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