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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hsin Rau Chien-Hung Wu Wei-Jung Shiang Po-Tsang Huang |
| Copyright Year | 2010 |
| Description | Author affiliation: Department of Industrial and Systems Engineering, Chung Yuan Christian University, Chungli, Taiwan 320, R.O.C (Hsin Rau; Chien-Hung Wu; Wei-Jung Shiang; Po-Tsang Huang) |
| Abstract | This study develops a decision support system for printed circuit board (PCB) inner layer fabrication, which includes defect inspection system and statistical process control (SPC) system. The defect inspection system is capable of automatically inspecting ten types of defects in the etching process in order to maintain the quality of product. The SPC system is to detect process problems, when process is out of control. In this study, five common process problems can be recognized by the SPC system. With the help of these two systems, people can make better decisions during the manufacturing processing. |
| Starting Page | 2454 |
| Ending Page | 2458 |
| File Size | 415074 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781424465262 |
| e-ISBN | 9781424465279 |
| DOI | 10.1109/ICMLC.2010.5580782 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-07-11 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Inspection Decision support systems Process control Pixel Databases Manufacturing processes Etching Defect inspection Decision support system Statistical process control PCB |
| Content Type | Text |
| Resource Type | Article |
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