NDLI: Dynamic thermal management for FinFET-based circuits exploiting the temperature effect inversion phenomenon

Content Provider	IEEE Xplore Digital Library
Author	Woojoo Lee Yanzhi Wang Tiansong Cui Nazarian, S. Pedram, M.
Copyright Year	2014
Description	Author affiliation: Univ. of Southern California, Los Angeles, CA, USA (Woojoo Lee; Yanzhi Wang; Tiansong Cui; Nazarian, S.; Pedram, M.)
Abstract	Due to limits on the availability of the energy source in many mobile user platforms (ranging from handheld devices to portable electronics to deeply embedded devices) and concerns about how much heat can effectively be removed from chips, minimizing the power consumption has become a primary driver for system-on-chip designers. Because of their superb characteristics, FinFETs have emerged as a promising replacement for planar CMOS devices in sub-20nm CMOS technology nodes. However, based on extensive simulations, we have observed that the delay vs. temperature characteristics of FinFET-based circuits are fundamentally different from that of the conventional bulk CMOS circuits, i.e., the delay of a FinFET circuit decreases with increasing temperature even in the super-threshold supply voltage regime. Unfortunately, the leakage power dissipation of the FinFET-based circuits increases exponentially with the temperature. These two trends give rise to a tradeoff between delay and leakage power as a function of the chip temperature, and hence, lead to the definition of an optimum chip temperature operating point (i.e., one that balances concerns about the circuit speed and power efficiency.) This paper presents the results of our investigations into the aforesaid temperature effect inversion (TEI) and proposes a novel dynamic thermal management (DTM) algorithm, which exploits this phenomenon to minimize the energy consumption of FinFET-based circuits without any appreciable performance penalty. Experimental results demonstrate 40% energy saving (with no performance penalty) can be achieved by the proposed TEI-aware DTM approach compared to the best-in-class DTMs that are unaware of this phenomenon.
Starting Page	105
Ending Page	110
File Size	1066882
Page Count	6
File Format	PDF
DOI	10.1145/2627369.2627608
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-08-11
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Association for Computing Machinery, Inc. (ACM)
Subject Keyword	FinFETs Delays Temperature CMOS integrated circuits Threshold voltage Energy consumption Integrated circuit modeling Thermal management Low-power designs FinFET
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in