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Content Provider | IEEE Xplore Digital Library |
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Author | Goossen, K.W. Knox, W.H. |
Copyright Year | 1999 |
Description | Author affiliation: Lucent Technol., Bell Labs., Holmdel, NJ, USA (Goossen, K.W.) |
Abstract | Many optical devices, but particularly vertical-cavity surface emitting lasers (VCSEL's), require high reflectivity mirrors. These mirrors are typically stacks of quarter-wavelength thick layers (as measured in the material), of alternating high and low index layers, placed on the device either by epitaxial techniques, or by dielectric deposition techniques such as evaporation. For bottom emitters, the thickness of these mirrors can be greatly reduced by capping the stack with a low optical loss metal (the thickness of the last dielectric layer would be adjusted for optical phase matching). |
Starting Page | 171 |
Ending Page | 172 |
File Size | 318887 |
Page Count | 2 |
File Format | |
ISBN | 0780356349 |
ISSN | 10928081 |
DOI | 10.1109/LEOS.1999.813533 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1999-11-08 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Tin Mirrors Vertical cavity surface emitting lasers Stimulated emission Dielectric losses Optical devices Surface emitting lasers Reflectivity Dielectric measurements Thickness measurement |
Content Type | Text |
Resource Type | Article |
Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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