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2013 IEEE International Integrated Reliability Workshop Final Report

2012 IEEE International Integrated Reliability Workshop Final Report

2011 IEEE International Integrated Reliability Workshop Final Report

2010 IEEE International Integrated Reliability Workshop Final Report

Management committee

Life beyond Si: More Moore or More than Moore?

On the universality of negative bias temperature degradation

On the ‘permanent’ component of NBTI

Recovery of negative and positive bias temperature stress in pMOSFETs

The impact of recovery on BTI reliability assessments

Correlation between dielectric traps and BTI characteristics of high-k/ metal gate MOSFETs

Requirement of effective fabless/foundry interactions for achieving robust product reliability

Foundry reliability engineering requirement & challenges

Photovoltaic module reliability: Enduring a storm

Soft errors — Past history and recent discoveries

B10 finding and correlation to thermal neutron soft error rate sensitivity for SRAMs in the sub-micron technology

Alpha emission of fully processed silicon wafers

Defects in low-κ dielectrics and etch stop layers for use as interlayer dielectrics in ULSI

Copper - top interconnect reliability for mixed signal applications

Effect of reservoir on electromigration of short interconnects

Investigation into the effect of a “through silicon via”-process on the MOS transistor reliability of a standard 0.13µm CMOS technology

Impact of body tie and Source/Drain contact spacing on the hot carrier reliability of 45-nm RF-CMOS

Multiple microscopic defects characterization methods to improve macroscopic degradation modeling of MOSFETs

MOS transistor characteristics and its dependence of plasma charging degradation on the test structure layout for a 0.13µm CMOS technology

Hot carrier impact on the small signal equivalent circuit

‘Atomistic’ simulation of RTS amplitudes due to single and multiple charged defect states and their interactions

Stability and bias stressing of metal/insulator/metal diodes

Qualifying reliable systems from unreliable components

Single Bit Read Disturb failure mechanism and transistor size optimization for dual port SRAM bitcell in embedded NVM process SOC applications

Characterization of anomalous erase effects in 48 nm TANOS memory cells

Cycling induced degradation of a 65nm FPGA flash memory switch

Impact of the storage layer charging on Random Telegraph Noise behavior of sub-50nm charge-trap-based TANOS and floating-gate memory cells

Evaluation of x-ray irradiation on 65nm Multi-Level Cell NOR flash technologies

A novel virtual age reliability model for Time-to-Failure prediction

Downstream electromigration improvement in 45nm technology

Evaluation on the reliable operation of a Gate-Level Pipelined Self Synchronous system against PVT and aging

Memory reliability model for accumulated and clustered soft errors

An empirical model describing the MLC retention of charge trap flash memories

TDDB chip reliability in copper interconnects

Degradation of sub-micron gate AlGaN/GaN HEMTs due to reverse gate bias

SRAM cell reliability degradations due to cell crosstalk

The effect of Radon on soft error rates for wire bonded memories

Understanding the influence of antifuse bitcell dimensions the programming time and energy using an analytical model

Insights about reliability of Heterojunction Bipolar Transistor under DC stress

New DRAM HCI qualification method emphasizing on repeated memory access

Qualification of 128 Gb MLC NAND Flash for SMAP space mission

3D simulation of charge collection and SEU of 0.13µm partially depleted SOI SRAM

RAAPS: Reliability Aware ArchC based Processor Simulator

Design-in reliability for over drive applications in advanced technology

Improved evaluation of DRAM transistors and accurate resistance measurement for real chip contacts by nano-probing technique

Complexities of the non-volatile memory reliability testing caused by the test structure

Discussion group summary [5 summaries]

Call for papers

2009 IEEE International Integrated Reliability Workshop Final Report

2008 IEEE International Integrated Reliability Workshop Final Report

2007 IEEE International Integrated Reliability Workshop Final Report

2006 IEEE International Integrated Reliability Workshop Final Report

2005 IEEE International Integrated Reliability Workshop

IEEE International Integrated Reliability Workshop Final Report, 2004

IEEE International Integrated Reliability Workshop Final Report, 2003

IEEE International Integrated Reliability Workshop Final Report, 2002.

2001 IEEE International Integrated Reliability Workshop. Final Report (Cat. No.01TH8580)

2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515)

1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460)

1998 IEEE International Integrated Reliability Workshop Final Report (Cat. No.98TH8363)

1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319)

1996 International Integrated Reliability Workshop Final Report

IEEE 1995 International Integrated Reliability Workshop. Final Report

Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)

International Integrated Reliability Workshop Final Report

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