NDLI: On intrinsic failure rate of products with error correction

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On intrinsic failure rate of products with error correction

Content Provider	IEEE Xplore Digital Library
Author	Guoqiao Tao Bisschop, J. Nath, S.
Copyright Year	2005
Description	Author affiliation: Philips Semicond., Nijmegen, Netherlands (Guoqiao Tao; Bisschop, J.; Nath, S.)
Abstract	The bathtub curve is widely used in the reliability world to illustrate three characteristics of the system (or an IC) failure rate curve: the early failure rate during initial phase of life, the intrinsic random constant failure rate in the use life, and the wear-out phase at the end-of-life (Reddy, 2003). The bottom part is usually characterised by a constant failure rate expressed in FIT (failure in time, which is 1 failure in 109 device hours). As systems become more and more complex, more and more redundancy and EDAC (error detection and correction, also called error correction code ECC) are implemented in order to improve the system robustness and reliability (Slayman, 2003 and Ziegler and Puchner, 2004). By studying the data retention failure rates of Flash products with ECC, we found that the bottom part of the bathtub (used to be characterized by "random constant failure rate") is not flat. We suggest replace the FIT number by a cumulative failure fraction with a certain time stamp.
File Size	2464220
File Format	PDF
ISBN	0780389921
DOI	10.1109/IRWS.2005.1609566
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-10-17
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Error correction Stress Testing Error correction codes Life estimation Nonvolatile memory Redundancy Robustness Leakage current Voltage
Content Type	Text
Resource Type	Article

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