NDLI: Power supply arcing

Content Provider	IEEE Xplore Digital Library
Author	Singh, P. Mazzuca, S. Yao, Y. Galyon, G. Ronken, V. Hedlund, L. Kinnard, J.
Copyright Year	2000
Description	Author affiliation: Server Div., IBM Corp., Poughkeepsie, NY, USA (Singh, P.)
Abstract	The trend to pack more power in smaller spaces is leading to higher rates of computer power supply arcing in the field. Power density increase is being achieved by decreasing the spacing between features such as the power train MOSFET leads and by increasing the switching frequency. Both of these changes make power supplies more prone to field arcing. This paper discloses a technique called the partial vacuum test to predict the arcing propensity in power supplies. The partial vacuum test also helps determine the corrective actions needed to avoid field arcing by indicating the locations susceptible to arcing. The paper also describes a test called the zinc spray test that can help determine the minimum spacing between features, subjected to high voltages with high frequency harmonics, that will not arc in the field.
Starting Page	29
Ending Page	32
File Size	438540
Page Count	4
File Format	PDF
ISBN	0780364376
DOI	10.1109/IWIPP.2000.885177
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-07-14
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Power supplies Testing Vacuum arcs MOSFET circuits Power MOSFET Switching frequency Vacuum technology Zinc Spraying Voltage
Content Type	Text
Resource Type	Article

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