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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Bartley, P.G. Begley, S.B. |
| Copyright Year | 2012 |
| Description | Author affiliation: Innovative Measurements Solutions, Inc., Portsmouth, Virginia, USA (Bartley, P.G.) || Agilent Technologies, Inc., Santa Rosa, California, USA (Begley, S.B.) |
| Abstract | A new method for performing a full two-port s-parameter calibration in free-space is presented. The proposed calibration technique computes the error coefficients from measurements made on an empty fixture and a measurement made on a metal plate of known thickness. Time-domain gating was employed. This technique requires fewer and simpler standards than the existing thru-reflect-line (TRL) and thru-reflect-match (TRM) calibration techniques. It requires the same calibration standards as the gated-reflect-line (GRL) method but doesn't require performing a coaxial or waveguide calibration at the end of the cables connected to the antennas. Permittivity calculated from measurements, calibrated using this technique, made on a material sample appear to be superior to results published using the TRL and TRM calibration technique and the same as those for a GRL calibration. |
| Starting Page | 47 |
| Ending Page | 51 |
| File Size | 1159008 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781457717734 |
| ISSN | 10915281 |
| e-ISBN | 9781457717727 |
| DOI | 10.1109/I2MTC.2012.6229351 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-05-13 |
| Publisher Place | Austria |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Calibration Metals Transmission line measurements Permittivity measurement Reflection Fixtures Materials time domain gating Network analyzer calibration s-parameters calibration free-space measurements material measurement dielectric permittivity time domain |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation Electrical and Electronic Engineering |
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