NDLI: Study on Rapid Measurement of Soybeans Moisture Content Based on Dielectric Properties

Content Provider	IEEE Xplore Digital Library
Author	Yidan Bao Zeyan Zhu Yanping Wu Yong He
Copyright Year	2004
Description	Author affiliation: Coll. of Biosyst. Eng. & Food Sci., Zhejiang Univ., Hangzhou (Yidan Bao; Zeyan Zhu; Yanping Wu; Yong He)
Abstract	For the purpose of rapid and nondestructive determination of soybean moisture content, a new measurement principle based on the dielectric properties of the measured plant material was proposed and a moisture measuring device making use of this principle was designed. The device was comprised of a sleeve capacitance in which the soybeans to be measured was packed, a signal generator and a signal measuring instrument. The relationships between relevant dielectric parameters (equivalent capacitance, resistance and loss tangent) and moisture content of soybeans in the capacitance cylinder under different excitation frequency were examined. In the tests performed in our laboratory, the optimal frequency was found to be about 1 kHz, at which the capacitance in relation to moisture content can be represented by a power function. The errors involved in this new method were analyzed
Starting Page	232
Ending Page	235
File Size	95568
Page Count	4
File Format	PDF
ISBN	0780388798
DOI	10.1109/IMTC.2005.1604106
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-05-16
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Dielectric measurements Moisture measurement Electrical resistance measurement Capacitance measurement Dielectric losses Frequency Dielectric devices Dielectric materials Signal generators Instruments Measurement Soybeans Dielectric properties Moisture content
Content Type	Text
Resource Type	Article

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