NDLI: Improved determination of the best fitting sine wave in ADC testing

Content Provider	IEEE Xplore Digital Library
Author	Kollar, I. Blair, J.J.
Copyright Year	2004
Description	Author affiliation: Dept. of Meas. & Inf. Syst., Budapest Univ. of Technol. & Econ., Hungary (Kollar, I.)
Abstract	The sine wave test of an ADC means to excite the ADC with a pure sine wave, look for the sine wave is which best fits the output in least squares sense, and analyze the difference. This is described in the IEEE standards 1241-2000 and 1057-1994. Least squares is the 'best' fitting method most of us can imagine. and it yields very good results indeed. Its known properties are achieved when the error (the deviation of the samples from the true sine wave) is random, white (the error samples are all independent), with zero mean Gaussian distribution. Then the LS fit coincides with the maximum likelihood estimate of the parameters. However, in sine wave testing of ADCs these assumptions are far from being true. The quantization error is partly deterministic, and the sample values are strongly interdependent. This makes the sine fit worse than expected, and since small changes in the sine wave affect the residuals significantly, especially close to the peaks, ADC error analysis may become misleading. Processing of the residuals (e.g. the calculation of the effective number of bits, ENOB) can exhibit serious errors. This paper describes this phenomenon, analyses its consequences, and suggests modified processing of samples and residuals to reduce the errors to negligible level.
Sponsorship	IEEE Instrumentation and Measurement Soc
Starting Page	829
Ending Page	834
File Size	439495
Page Count	6
File Format	PDF
ISBN	078038248X
ISSN	10915281
DOI	10.1109/IMTC.2004.1351190
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-05-18
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Least squares methods System testing Frequency Parameter estimation Information systems USA Councils Read only memory Error analysis Performance analysis Gaussian processes
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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