NDLI: Off-device fault tolerance for digital imaging devices

Content Provider	IEEE Xplore Digital Library
Author	Jin, B. Park, N.-J. George, K.M. Park, N. Lombardi, F. Kim, Y.B.
Copyright Year	2004
Description	Author affiliation: Dept. of Comput. Sci., Oklahoma State Univ., Stillwater, OK, USA (Jin, B.; Park, N.-J.; George, K.M.; Park, N.)
Abstract	Charged-coupled device (CCD) is one of the widely-used optical sensing device technologies for various digital imaging systems such as digital cameras, digital camcorders, and digital X-ray imaging systems. Pixels on a CCD may suffer from defective or faulty pixels due to numerous causes such as imperfect fabrication, excessive exposure to light radiation and sensing element aging to mention a few. As the use of high-resolution CCDs increase, defect and fault tolerance of such devices demands immediate attention. In this context, this paper proposes a testing and repair technique for defects/faults on such devices with inability of on-device fault tolerance, referred to as off-device fault tolerance. Digital image sensor devices such as CCD are by their nature, can not readily utilize traditional on-device fault tolerance techniques because each pixel on the device senses a unique image pixel coordinate. No faulty pixel can be replaced nor repaired by a sparse pixel as any displacement of an original pixel coordinate can not sense the original image pixel. Therefore, to effectively provide and enhance the reparability of such devices with inability of on-device fault tolerance, a novel testing and repair method for defects/faults on CCD is proposed based on the soft testing/repair method proposed in our previous work (Jin et al, 2003) under both single and clustered distribution of CCD pixel defects. Clustered fault model due to unwanted diffusion should be considered as practical model and for comparison purpose with single fault model. Also, a novel default/fault propagation model is proposed to effectively capture the on-device effects and faults off the device for an effectiveness and practicality of testing and repair process. The efficiency and effectiveness of the method is demonstrated with respect to the yield enhancement by the soft-testing/repair method under a clustered fault model as well as single fault model, as referred to as soft yield. Extensive numerical simulations are concluded.
Sponsorship	IEEE Instrumentation and Measurement Soc
Starting Page	627
Ending Page	632
File Size	411127
Page Count	6
File Format	PDF
ISBN	078038248X
ISSN	10915281
DOI	10.1109/IMTC.2004.1351127
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-05-18
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault tolerance Digital images Pixel Charge coupled devices Testing Optical sensors Digital cameras Video equipment X-ray imaging Optical device fabrication
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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