NDLI: A new adaptive analog test and diagnosis system

Content Provider	IEEE Xplore Digital Library
Author	Cota, E.F. Negreiros, M. Carro, L. Lubaszewski, M.
Copyright Year	1999
Description	Author affiliation: Dept. of Electr. Eng., Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil (Cota, E.F.)
Abstract	This paper presents a low cost analog test system with diagnosis capabilities. The tester is able to detect faults in any linear circuit by learning a reference plant behavior in a first step, and comparing this behavior against the output of the circuit under test in a second step. For a faulty circuit, a third step takes place to locate the fault. The diagnosis method consists on injecting probable faults in a mathematical model of the circuit, and later comparing its output with the output of the real faulty circuit. This system has been successfully applied to a case study, a biquad filter. Soft, large, and hard deviations on components, as well as faults in operational amplifiers were considered. Experimental results prove the feasibility and efficiency of the proposed test and diagnosis system.
Starting Page	1397
Ending Page	1402
File Size	580694
Page Count	6
File Format	PDF
ISBN	0780352769
ISSN	10915281
DOI	10.1109/IMTC.1999.776037
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1999-05-24
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	System testing Circuit testing Circuit faults Costs Electrical fault detection Fault detection Linear circuits Fault diagnosis Mathematical model Filters
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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