NDLI: Transfer matrix approach to study light scattering in complex layered media

Content Provider	IEEE Xplore Digital Library
Author	Ming-Chieh Lin Ruei-Fu Jao Kuo-Hua Huang
Copyright Year	2004
Description	Author affiliation: Dept. of Phys., Fu Jen Univ., Taipei, Taiwan (Ming-Chieh Lin; Ruei-Fu Jao; Kuo-Hua Huang)
Abstract	Many useful and interesting optical applications of thin films make use of multilayer stacks of films, or layered media. To evaporate multiple layers while maintaining control over both refractive index and individual layer thickness has become a matured technology today. In recent years, light scattering with nano-structures has received much attention due to the advancement of modern crystal-growth techniques such as MBE and CVD. In nano-scales, in which quantum mechanical principles play an essential role, material properties are different from that we observe in macroscopic world. Due to the size effect, the optical constants of nano-structures become much more complex than that of bulk material. In this work, light scattering in complex layered media is investigated. A transfer matrix approach is employed to discretize the dielectric function profile of the complex layered media and the transmission coefficient is calculated by matching the boundary conditions at each interface. The polarization effects and geometry-dependent characteristics are considered in our simulation model. The formulation and program are tested by comparing with some standard examples in the textbooks as limiting cases, /spl epsiv/(z) and /spl mu/(z) can be arbitrary complex functions in our calculations. Photonic band gaps (PBGs) have been studied. PBGs are affected seriously by the complexity of materials and the polarization. Field enhancement along with ATR is investigated. Left-handed materials are also considered. Detailed analysis is presented.
Sponsorship	Univ. of Karlsruhe Karlsruhe Res. Center
Starting Page	689
Ending Page	690
File Size	123783
Page Count	2
File Format	PDF
ISBN	0780384903
DOI	10.1109/ICIMW.2004.1422278
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-09-27
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Light scattering Nonhomogeneous media Optical films Optical refraction Optical scattering Optical variables control Solid modeling Thickness control Refractive index Molecular beam epitaxial growth
Content Type	Text
Resource Type	Article

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