NDLI: The use of phonon and plasmon interface modes as diagnostic tools for characterising low dimensional semiconductor structures

Content Provider	IEEE Xplore Digital Library
Author	Mirjalili, G. Shayesteh, S.F. Smith, S.R.P. Parker, T.J. Cheng, T.S. Foxon, C.T.
Copyright Year	2000
Description	Author affiliation: Dept. of Phys., Essex Univ., Colchester, UK (Mirjalili, G.)
Abstract	Far infrared Fourier transform spectroscopy is a well-established technique for investigating the dielectric response functions of phonons and plasmons in bulk and low-dimensional semiconductors. The vibrational properties of binary solids like the III-V and II-VI compound semiconductors are described quite well by a simple linear chain model which leads to a good description of the optical and acoustic branches of the phonon dispersion curves. In the long wavelength limit the model can be further developed to describe the polariton coupling between the photons and the optical phonons. This coupling leads to the-well-known reststrahlen band of high reflectivity between the transverse optic phonon frequency, /spl omega//sub TO/, and the longitudinal optic phonon frequency, /spl omega//sub LO/. The interface modes discussed here occur in the region of /spl omega//sub LO/.
Starting Page	303
Ending Page	304
File Size	194408
Page Count	2
File Format	PDF
ISBN	0780365135
DOI	10.1109/ICIMW.2000.893042
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-09-12
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Phonons Plasmons Infrared spectra Optical coupling Frequency Fourier transforms Electrochemical impedance spectroscopy Dielectrics Solids III-V semiconductor materials
Content Type	Text
Resource Type	Article

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