NDLI: Yarn mass analysis with 1 mm capacitive sensors

Content Provider	IEEE Xplore Digital Library
Author	Carvalho, V. Monteiro, J. Vasconcelos, R.M. Soares, F.O.
Copyright Year	2004
Description	Author affiliation: DEI, Portugal (Carvalho, V.; Monteiro, J.)
Abstract	This paper presents the advantages of analysing yarn evenness, based on mass variation, using a capacitive sensor which allows the measurement of 1 mm yarn length. The variation of capacity is due to the dielectric change and is proportional to the quantity of yarn mass between the sensor plates. Available commercial equipment uses a solution of 8 mm with the drawback of decreasing the resolution eight times. This limits the correct detection of Neps and other parameters. This type of fault (Nep), usually has a length between 1 and 4 mm, which can be measured directly with the new sensor. Commercial equipment detects this fault based on estimation. This paper also presents the spectral analysis of the yarn mass. This is important for textile quality control. Two approaches are presented, one based on a FFT model definition of narrow bands to aggregate the harmonics and other based on the Walsh-Hadamard transform. They show the wavelength detection of the sample taken into test, enabling the detection of the most common faults and errors, namely: fibre wavelength, and production faults. Furthermore, with the resolution presented it is possible to measure wavelengths in the range \|2 mm, 2 cm\|, which is impossible with commercial available solutions. The information obtained in this interval, is of utmost importance as it allows the characterization of the fibres in some types of yarns. The main objective of the project is to increase the quality specifying strict requirements allowing, in the near future, real-time actuation on a ring spinning frame.
Starting Page	633
Ending Page	638
File Size	2695653
Page Count	6
File Format	PDF
ISBN	0780383044
DOI	10.1109/ISIE.2004.1571880
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-05-04
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Yarn Capacitive sensors Fault detection Length measurement Optical fiber devices Dielectric measurements Spectral analysis Textiles Quality control Narrowband Signal processing Yarn Evenness Capacitive Sensor
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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