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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Wells, N. Driskell, T. Camparo, J. |
| Copyright Year | 2014 |
| Description | Author affiliation: Photonics Technol. Dept., Aerosp. Corp., El Segundo, CA, USA (Wells, N.; Driskell, T.; Camparo, J.) |
| Abstract | Accurately assessing temperature variations of vapor-phase systems is a non-trivial problem, and one that has significant implications for the long-term stability of atomic frequency standards. As an example, consider the straightforward case of attempting to measure and stabilize the vapor temperature of Rb in a gas-cell atomic clock. Routinely, the temperature of the vapor is measured by placing a thermocouple or thermistor at the cold point of the resonance cell's exterior (i.e., the region of the liquid Rb pool). As a consequence of vapor-phase/condensed-phase equilibrium, this temperature defines the Rb vapor density and by implication its mean kinetic energy. However, using a temperature probe in this manner has at least two problems: 1) the temperature of the vapor is not measured directly, only the temperature at a point on the exterior of the vapor's glass container is measured, and 2) the temperature gradients that likely exist over the vapor's volume are ignored. One can, of course, place additional probes on the cell's exterior, but this still leaves the question of how cell-exterior temperature gradients map to interior-vapor gradients. Therefore, in order to improve the long-term stability of next-generation atomic clocks, there is a need for more accurate means of assessing actual vapor temperatures. |
| Sponsorship | IEEE Ultrason., Ferroelectr., Freq. Control Soc. |
| Starting Page | 1 |
| Ending Page | 1 |
| File Size | 94610 |
| Page Count | 1 |
| File Format | |
| ISBN | 9781479949151 |
| DOI | 10.1109/FCS.2014.6859964 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2014-05-19 |
| Publisher Place | Taiwan |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Temperature measurement Temperature sensors Atomic clocks Pressure measurement Stability criteria Thermal stability Probes |
| Content Type | Text |
| Resource Type | Article |
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