NDLI: Phase noise limitation due to amplitude frequency effects in state-of-the-art quartz oscillators

Content Provider	IEEE Xplore Digital Library
Author	Besson, R.J. Boy, J.J. Mourey, M. Ferre-Pikal, E.S. Walls, F.L.
Copyright Year	1996
Description	Author affiliation: ENSMM LCEP, Besancon, France (Besson, R.J.)
Abstract	During the past two decades very important advances have been accomplished in reducing the phase modulation (PM) noise in state-of-the-art bulk wave quartz crystal oscillator. Various limitations have been significantly reduced, especially those related to dynamic temperature fluctuations, temperature gradients, 1/f noise in the electronic and amplitude frequency effects. Amplitude frequency effects have been studied in the past because they are so large in AT-cut resonators. The introduction of the SC-cut significantly reduced the sensitivity to amplitude fluctuations as well as the sensitivity to temperature fluctuations. The amplitude frequency effect in modern SC-cut resonators at 5 or 10 MHz is, however, far from negligible and its importance relative to temperature effects and 1/f amplifier noise must now be reexamined to chart the path to further advances in short-term stability. In this paper we show comparisons of the amplitude frequency effect in traditional 5 MHz AT-cut resonators to our results obtained with 5 MHz BVA AT-cut, 5 MHz BVA SC-cut, 10 MHz BVA AT-cut and several designs of 10 MHz BVA SC-cut resonators. We also compare these measurements with those obtained from 100 MHz resonators. A simple model in which an additional noise source arising from the amplitude frequency effect is introduced in the input of the resonator excited at a given power. This permits us to estimate the contribution of the amplitude frequency effect to /spl sigma//sub y/(/spl tau/).
Starting Page	839
Ending Page	843
File Size	335701
Page Count	5
File Format	PDF
ISBN	0780333098
DOI	10.1109/FREQ.1996.560263
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1996-06-05
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Phase noise Temperature sensors Fluctuations Noise level Noise reduction Frequency estimation Phase modulation Oscillators Stability Amplitude estimation
Content Type	Text
Resource Type	Article

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