NDLI: Polynomial time solvable fault detection problems

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Polynomial time solvable fault detection problems

Content Provider	IEEE Xplore Digital Library
Author	Chakradhar, S.T. Agrawal, V.D. Bushnell, M.L.
Copyright Year	1990
Description	Author affiliation: Dept. of Comput. Sci., Rutgers Univ., Piscataway, NJ, USA (Chakradhar, S.T.)
Abstract	A class of combinational circuits, called the (k,K)-circuits is presented, and a polynomial-time algorithm to detect any single or multiple stuckfault in such circuits is introduced. The (k,K)-circuits are a generalization of H. Fujiwara's (1988) K-bounded circuits. The fault detection problem is formulated as an energy minimization problem using the bidirectional neural net model proposed earlier. A minimizing point of the energy function corresponds to a test. A polynomial-time algorithm is presented here to solve the single and multiple fault-detection problem for the (k,K)-circuits by recursively eliminating variables in the energy function.<>
Starting Page	56
Ending Page	63
File Size	659720
Page Count	8
File Format	PDF
ISBN	081862051X
DOI	10.1109/FTCS.1990.89335
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1990-06-26
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Polynomials Fault detection Electrical fault detection Circuit faults Combinational circuits Circuit testing Fault diagnosis Computer science Logic circuits Integrated circuit interconnections
Content Type	Text
Resource Type	Article

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