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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Mina Kim Won Hee Lee Se Yun Kim Hee Joon Kim Hoisik Moon Jong Beom Ra |
| Copyright Year | 2015 |
| Description | Author affiliation: Dept. of Electr. Eng., KAIST, Daejeon, South Korea (Mina Kim; Won Hee Lee; Jong Beom Ra) || Samsung Display Co., Ltd., Asan, South Korea (Se Yun Kim; Hee Joon Kim; Hoisik Moon) |
| Abstract | This paper presents an automated system to determine gamma curves of each individual pixel on a high-resolution flat panel display. The system consists of a panel and its aligned area scan camera located at a fixed position. To localize a panel pixel position in an image captured from the aligned camera, a mapping function estimation scheme is proposed between the panel and the camera coordinates. The mapping function is modeled by combining both 2-D perspective transform and lens distortion and is estimated via feature-based registration. Intensity values of individual panel pixel are then measured for sampled gray-levels. To alleviate intensity interferences from neighboring pixels, we propose to use evenly spaced dot images as panel input. By using the measured intensity values of each panel pixel, gamma curves are determined to examine the characteristics of defects on the panel, if any. Experimental results show the relevance of the proposed method. |
| Starting Page | 1795 |
| Ending Page | 1799 |
| File Size | 787624 |
| Page Count | 5 |
| File Format | |
| ISBN | 9780992862633 |
| ISSN | 20761465 |
| DOI | 10.1109/EUSIPCO.2015.7362693 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-08-31 |
| Publisher Place | France |
| Access Restriction | Subscribed |
| Rights Holder | EURASIP |
| Subject Keyword | Image resolution Machine vision Nonlinear distortion Estimation Gamma curve determination Transforms Defect inspection Cameras High-resolution flat panel display Lenses |
| Content Type | Text |
| Resource Type | Article |
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