NDLI: Nanocrystallized CdS for detection of UV light with picowatt sensitivity through single shot KrF laser treatment

Content Provider	IEEE Xplore Digital Library
Author	Keng-Te Lin Hsuen-Li Chen Yu-Lun Liu Yi-Chuan Tseng Cheng-Hsi Lin Ho-Ming Chang Jui-Min Liu Yu-Sheng Lai
Copyright Year	2015
Description	Author affiliation: Dept. of Mater. Sci. & Eng., Nat. Taiwan Univ., Taipei, Taiwan (Keng-Te Lin; Hsuen-Li Chen; Yu-Lun Liu; Yi-Chuan Tseng; Cheng-Hsi Lin) \|\| Nat. Nano Device Labs., Nat. Appl. Res. Labs., Hsinchu, Taiwan (Ho-Ming Chang; Jui-Min Liu; Yu-Sheng Lai)
Abstract	In this study we demonstrated that the improvement of detection capability of cadmium sulfide (CdS) photoconductors in the ultraviolet (UV) regime is much larger than that in the visible regime, suggesting that the deep UV laser treated CdS devices are very suitable for low-light detection in the UV regime. In addition, we determined that a nanocrystallized CdS photoconductor can behave as a picowatt-sensitive detector in the UV regime after ultra-shallow-region crystallization of the CdS film upon a single shot from a KrF laser. The strategy proposed herein appears to have great potential for application in the development of CdS photoconductors for picowatt-level detection of UV light with low power consumption.
Starting Page	217
Ending Page	220
File Size	1686677
Page Count	4
File Format	PDF
ISBN	9784863484771
DOI	10.1109/AM-FPD.2015.7173247
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-07-01
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	JSAP
Subject Keyword	Power system measurements Density measurement Films Wavelength measurement Photoconducting materials Crystallization Surface treatment
Content Type	Text
Resource Type	Article

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