NDLI: Effective Steganalysis of YASS Based on Statistical Moments of Wavelet Characteristic Function and Markov Process

Content Provider	IEEE Xplore Digital Library
Author	Xiang Yang Zhang Wen-hua
Copyright Year	2012
Abstract	A promising steganograhic method-Yet Another Steganographic Scheme(YASS) was designed to resist calibration based blind steganalysis via embedding data in randomized locations. The existing steganalysis methods analyze it ineffectively or use high-dimensional feature set or are targeted steganalysis methods. In this paper, we present a steganalysis method of lower-dimensional feature sets, and it can effectively detect YASS. The 198-dimensional feature vector is calculated in the wavelet domain as statistical moments of wavelet characteristic function and Markov process features of low frequency coefficients. A SVM based classifier is trained on the extracted features for the detection of the presence of steganography. Experimental results show that the new feature set provides significantly better results for detecting YASS than previous art.
Starting Page	606
Ending Page	610
File Size	198733
Page Count	5
File Format	PDF
ISBN	9781467306898
e-ISBN	9780769546476
DOI	10.1109/ICCSEE.2012.218
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-03-23
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Markov process Histograms YASS Wavelet domain Wavelet transform Transform coding Markov processes Feature extraction Discrete cosine transforms Arrays
Content Type	Text
Resource Type	Article

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