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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Durier, A. Pues, H. Vande Ginste, D. Chernobryvko, M. Gazda, C. Rogier, H. |
| Copyright Year | 2011 |
| Description | Author affiliation: Automotive Quality Labs. EMC Design Support, Continental Automotive France SAS, Toulouse, France (Durier, A.) || Dev. Eng. Group EMC, MELEXIS Technol. NV, Tessenderlo, Belgium (Pues, H.) || Dept. of Inf. Technol., Ghent Univ. Ghent, Ghent, Belgium (Vande Ginste, D.; Chernobryvko, M.; Gazda, C.; Rogier, H.) |
| Abstract | Electronics suppliers of automotive industry use BCI (Bulk Current Injection) measurements to qualify immunity robustness of their equipment whereas electronics components manufacturers use DPI (Direct Power Injection) to qualify immunity of their component. Due to harness resonances, levels obtained during a BCI test exceed standard DPI requirements imposed by automotive suppliers onto components' manufacturers. We propose to use BCI set-up modeling to calculate the equivalent DPI level obtained at the component level during equipment testing and to compare results with DPI measurements realized at IC level. |
| Sponsorship | IEEE Croatia Sect. |
| Starting Page | 41 |
| Ending Page | 46 |
| File Size | 1722964 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781457708626 |
| e-ISBN | 9789531841580 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-11-06 |
| Publisher Place | Croatia |
| Access Restriction | Subscribed |
| Rights Holder | Univ of Zagreb |
| Subject Keyword | Application specific integrated circuits Solid modeling IC immunity Immunity testing BCI DPI Integrated circuit modeling Probes Modeling Load modeling |
| Content Type | Text |
| Resource Type | Article |
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